過去のお知らせ
Proficiency-level estimation using heterogeneous features via label dequantized CCA
Tatsuki Seino, Naoki Saito, Takahiro Ogawa, Satoshi Asamizu, Miki Haseyama
2023 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW 2023)
Tatsuki Seino, Naoki Saito, Takahiro Ogawa, Satoshi Asamizu, Miki Haseyama
2023 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW 2023)