過去のお知らせ
Estimating regions of deterioration in electron microscope images of rubber materials via a transfer learning-based anomaly detection model
Ren Togo, Naoki Saito, Takahiro Ogawa, Miki Haseyama
IEEE Access
Ren Togo, Naoki Saito, Takahiro Ogawa, Miki Haseyama
IEEE Access